Real-Time Microscopy with ParticleView

    Real-Time Microscopy for Crystals, Particles and Droplets

    ParticleView with PVM Technology


    Solve Difficult Particle Problems Using Image-Based Evidence

    Common ParticleView with PVM applications include:

    • Control Crystal Size and Shape Distribution
    • Using Solubility and M...

    Common ParticleView with PVM applications include:

    Since acquiring Lasentec in 2001, METTLER TOLEDO has continued to advance the development of ParticleTrack with FBRM and ParticleView with PVM technologies. With thousands of installations worldwide from the R&D laboratory to the manufacturing plant, our probe-based technologies are acknowledged as the gold standard for measuring and visualizing the rate and degree of change in particle and droplet systems as they naturally exist in process.


    Products and Specs

    Particle Vision and Measurement (PVM) Models

    Products and Specs
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    Probe Wetted Material
    Probe Window Material
    Probe Wetted Temperature Range
    Probe Wetted Pressure Range
    Material No.: 14000031
    See details
    Probe Wetted MaterialC22 alloy
    Probe Window MaterialSapphire
    Probe Wetted Temperature Range-80°C to 120°C (purged);10°C to 120°C (standard)
    Probe Wetted Pressure Range0 barg to 10 barg (standard);up to 100 barg (custom)
    CertificationsClass 1 Laser Device compliant with 21CFR1040.10, 21CFR1040.11 and IEC 60825;Probe back end rated for IP65 and 4X;EN 61326-1;IEC/UL/CSA 61010-1
    For Use InLaboratory: EasyMax, OptiMax or Larger
    SoftwareiC PVM
    Imaging SystemFront Lasers: Backscattered images; Back Lasers: Transmission images with use of optional clamp-on reflector
    IlluminationInternal light source;Front Lasers: 4;Back Lasers: 4
    Probe Window SealsTM (standard, no o-rings)
    Probe Diameter19 mm [0.75 in]
    Probe Wetted Length400 mm [15.75 in]
    Conduit Length2 m [6.6 ft]
    Field of View1300 μm x 890 μm
    Optical Resolution> 2 μm
    Image Resolution1500 x 1024 pixels
    Weight (probe, interface unit and cables)1.45 kg [3.20 lb]
    Air RequirementsAlways use clean, dry instrument quality air or Nitrogen;Low flow purge (optional, use to avoid condensation), 1.4 barg [20 psig], 0.5 SLPM [0.02 SCFM]
    Power RequirementsPowered USB extender;100-240V (auto-switching), 50/60Hz, 0.3A


    Documentation for Probe-Based Real Time Microscopy


    ParticleView V19 With PVM Technology
    Visualize particles and particle mechanisms in real time to study particle size and shape
    iC PVM Software
    View particles in real time to study particle size, shape and concentration with iC PVM

    White Papers

    Understand Crystallization with In Situ Microscopy
    Dynamic mechanisms key to understanding crystallization processes can now be observed with in situ microscopy. A white paper explains how leading chem...


    Introducing Crystallization and Precipitation
    Crystallization is an important process in the chemical, petrochemical and pharmaceutical industries. Guidelines for engineering challenging unit ope...
    Optimization and Scale-up of Batch Crystallization
    A well-designed batch crystallization process is one that can be scaled successfully to production scale - giving the desired crystal size distributio...
    Solubility and Metastable Zone Width (mzw) Determination
    Solubility curves are commonly used to illustrate the relationship between solubility, temperature, and solvent type. By plotting temperature vs. solu...
    Crystal Nucleation and Growth
    Scientists and engineers gain control of crystallization processes by carefully adjusting the level of supersaturation during the process. Supersatur...
    Measure Crystal Size Distribution
    In-process probe-based technologies are applied to track particle size and shape changes at full concentration with no dilution or extraction necessar...
    Crystallization Seeding Protocol
    Seeding is one of the most critical steps in optimizing crystallization behavior. When designing a seeding strategy, parameters such as: seed size, se...
    Anti-Solvent Addition on Supersaturation
    In an anti-solvent crystallization, the solvent addition rate, addition location and mixing impact local supersaturation in a vessel or pipeline. Scie...
    Temperature Effects Crystallization Size and Shape
    The cooling profile has a major impact on supersaturation and kinetics of crystallization Process temperature is optimized to match the surface are o...
    Temperature Effects Crystallization Size and Shape
    Changing the scale or mixing conditions in a crystallizer can directly impact the kinetics of the crystallization process and the final crystal size....
    Particle and Droplet Processing
    Understand and optimize particle size distributions.
    Process Analytical Technology (PAT)
    Process Analytical Technology (PAT) is changing the way R&D, scale-up, and manufacturing are performed. PAT transforms productivity, improves safety,...

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    iC PVM particle characterization software
    Acquire and share process knowledge by viewing particles in real time to understand particle size, shape and concentration with iC PVM Software.
    iC Data Center
    Capture, Prepare, Share Experimental Data


    Crystallization and Precipitation Citation List
    Crystallization and precipitation citation list and publications

    On-Demand Webinars

    Crystallization Image Analysis
    This presentation describes the role of image analysis in crystallization monitoring.
    Liquid-Liquid Phase Separation
    This presentation describes a strategy employed to design and develop robust, scalable crystallization processes that avoids Liquid-Liquid Phase Separ...
    Agglomeration & Crystallization Using Particle Measurement
    This presentation details how using data from in situ particle vision and measurement tools can be used to determine particle size and shape trends re...


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    Explore our Services - Tailored to Fit your Equipment

    We support and service your measurement equipment through its entire life-cycle, from installation to preventive maintenance and calibration to equipment repair.

    Maintenance & Optimization
    Training & Consulting


    V19 Hardware Support

    Positioning a ParticleTrack or ParticleView Probe
    ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
    Using the Purge Controller for ParticleTrack G400 or ParticleView V19
    The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...
    ParticleView V19 Hardware Manual
    This manual covers specific safety and quality information relating to the ParticleView V19 with PVM (Particle Vision Measurement) technology. The P...
    ParticleView V19 Safety Manual
    This safety manual supplements the ParticleView V19 with PVM Technology Hardware Manual.
    ParticleTrack & ParticleView Onsite Training
    Training and familiarization with ParticleTrack with FBRM technology and ParticleView with PVM technology will ensure that all users can walk up to in...

    V19 Software Support

    iC PVM Software Quick Start Guide
    This guide introduces a new user to the iC PVM software graphical user interface (GUI) and describes several choices for getting started. Create and r...
    iC PVM Software User Install Guide
    iC PVM installation is wizard-guided. This guide includes detailed installation steps along with implementation information for the iC PVM administra...
    ParticleTrack & ParticleView Onsite Training
    Training and familiarization with ParticleTrack with FBRM technology and ParticleView with PVM technology will ensure that all users can walk up to in...
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