ParticleTrack G400

ParticleTrack G400

Study Particle Size and Count in the Laboratory

ParticleTrack G400 with FBRM Technology is a probe-based instrument that is inserted directly into laboratory reactors to track changing particle size and count in real time at full process concentrations. Particles, particle structures and droplets are monitored continuously, as experimental conditions vary, providing scientists with the evidence required to deliver consistent particles with the required attributes.

Particle size and count directly impact performance in multiphase processes including crystallization, emulsification and flocculation. By monitoring particle size and count in real time scientists can understand, optimize and scale-up processes confidently using evidence-based methods.

Particles can change when sampled and prepared for offline analysis. By tracking changes to size and count, as particles naturally exist in process, scientists obtain process understanding safely and with no time delay – even at extremes of temperature and pressure.

By monitoring particles continuously, as experimental conditions are varied, it is possible to determine the influence of process parameters on particle size and count. This unique information can be used to design processes that will consistently deliver particles with optimized attributes.

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Common applications for ParticleTrack G400 in the laboratory include:

Key Features of ParticleTrack G400:

  • Compact design for portability and minimal laboratory footprint
  • Interchangeable probes for use across a whide range of laboratory scales (10mL to 2L)
  • Seemless integration with OptiMax and EasyMax synthesis workstations for optimized experimental setup
  • iC FBRM software for fast and intuitive particle data analysis

ParticleTrack G400 represents a significant improvement over previous METTLER TOLEDO Lasentec FBRM technologies (S400 and D600).

Specificaties

Specificaties - ParticleTrack G400

Meetbereik
0,5 – 2.000 μm
0,5 tot 2.000 μm
Temperatuurbereik (basis/veldeenheid)
5 tot 35 °C
Omschrijving basiseenheid
Laboratoriumbasiseenheid
Afmetingen basiseenheid (LxHxB)
492 mm x 89 mm x 237 mm
CE
CE-goedgekeurd, Klasse 1 Laser, NRTL-gecertificeerd, CB-gecertificeerd
Voedingsvereisten
100-240 VAC, 50/60 Hz, 1,2 A
Voor gebruik In
Laboratorium: EasyMax/OptiMax
Software
iC FBRM
Scansysteem
Elektrische scanner
Scansnelheden
2 m/s (19 mm bij 1,2 m/s)
Selectiemethode van de peeslengte
Primair (fijn) én Macro (grof)
Sondediameter
19 mm
9,5 mm
14/9,5 mm
Lengte van de bevochtigde sonde
400 mm (voor 19 mm sonde)
206 mm (voor 14/9,5 mm sonde)
91 mm (voor 9,5 mm sonde)
Bevochtigde legering van de sonde
C22
Venster
Saffier
Standaard vensterafdichtingen
Kalrez® (standaard 19 mm)
TM (standaard 14/9,5)
TM (standaard 9,5, 14/9,5)
Sonde-/vensteropties
TM-venster (optie voor 19 mm)
Drukklasse (sonde)
tot 100 bar(g) (aangepast)
3 bar(g) (standaard)
Temperatuur klasse (sonde)
+10 tot 90 °C (standaard)
-10 tot 90 °C (Kalrez en spoeling)
-80 tot 90 °C (TM en spoeling)
Leidinglengte
3 m [9,8 ft]
Luchtvereisten
Max. uitlaatdruk voor spoeling spruitstuk: 0,8 bar(g) [12 psi(g)]
Max. inlaatdruk voor spoeling spruitstuk: 8,6 bar(g) [125 psi(g)]
Laag spoelingsdebiet: (om condensatie te vermijden)
Max. debiet: 5 N l/min [0,2 SCFM]
ParticleTrack-model
ParticleTrack G400
  • Study Particle Size and Count Over Time
    Scientists insert ParticleTrack probes directly into process streams to monitor particle size and count continuously over time without having to take a sample. This unique information becomes the basis for effective understanding of every process that involves crystals, particles and droplets.

  • Link the Process to the Particle System
    With ParticleTrack, scientists routinely determine how process parameters influence particle systems. The impact of process parameters on mechanisms such as growth, agglomeration, breakage and shape change can be identified, allowing processes to be optimized and improved using evidence-based methods.

  • Create Fit-for-Purpose Particle Systems
    Scientists use ParticleTrack to determine how particles with the desired size and count can be delivered consistently. By choosing optimized process parameters during development, through scale-up and into production, scientists deliver high quality particle products to the market faster at a lower total cost.

  • Monitor and Correct Process Deviations
    ParticleTrack is used to monitor, troubleshoot and improve established processes in production. Difficult processes, where sampling is a challenge, can be monitored safely, ensuring particles with the highest possible quality are produced consistently.

ParticleTrack G400 with FBRM Technology is not rated for explosive locations.

Documentatie

Data Sheets

ParticleTrack G400 Datasheet
Insert into lab reactors to track changing particle size and count in real time at full process concentrations.

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Accessoires

Verbruiksartikelen

Software

More Information

ParticleTrack G400 represents a significant improvement over previous METTLER TOLEDO Lasentec FBRM technologies (S400 and D600).

Stuck Particle Correction Improves Consistent and Reliable Measurement - ParticleTrack can distinguish between particles stuck on the probe window and those moving in the process. These stuck particles can be removed from the data ensuring a consistent and reliable measurement for more experiments.

ParticleTrack G400
Figure 1: Comparison of measured chord length distribution for legacy Lasentec FBRM vs. ParticleTrack with FBRM technology.
ParticleTrack G400
Figure 2: Example of legacy Lasentec FBRM instrument failing to observe bimodal distribution of large and small particles, while ParticleTrack displays higher resolution measurement of both particle sizes.

Improved Measurement Accuracy and Resolution - ParticleTrack uses state-of-the art digital signal processing methods to measure particle size with increased accuracy and resolution. These changes mean the measurement matches particle measurements such as laser diffraction and imaging more closely.

Wider Dynamic Range To Detect Critical Process Events - ParticleTrack measures changes in particle count to accurately eliminate concentration-related artifacts from the data and ensure improved sensitivity to changes in the particle system at higher concentrations.  This allows critical process events to be detected that may previously have gone unobserved.

ParticleTrack G400
Figure 3: Example of ParticleTrack identifying a secondary nucleation event at the end of a process while at high concentration.
ParticleTrack G400
Figure 4: Interchangeable probe configurations for the same instrument are shown.

Interchangeable Probes Decrease Costs and Increase Range of Scales - Lab-based ParticleTrack instruments are now available with different sized probes that can be easily changed by the user.  This improves serviceability and increases the range of scales where the same instrument may be used at an overall lower cost.

Two Measurements Acquired Simultaneously To Eliminate Need for Prior System Information or Trial Experimentation - ParticleTrack now collects two datasets simultaneously that are optimized for different types of particle systems. This eliminates the need for any a prior system information or trial experimentation to determine the optimal measurement method.

Improved Instrument to Instrument Repeatability - ParticleTrack technology was developed to ensure different lab and production instruments now measure much more closely, allowing changes in scale of measurement to be decoupled from differences in the probe used to measure them.

ParticleTrack G400
Figure 5: Simultaneous measurement using two different modes using ParticleTrack: Primary is sensitive to the primary particles while Macro is sensitive to overall particle structure.


Voice of User

Senaputra, A., Jones, F., Fawell, P. D. and Smith, P. G. (2014), Focused beam reflectance measurement for monitoring the extent and efficiency of flocculation in mineral systems. AIChE J., 60: 251–265. doi: 10.1002/aic.14256.

      "The [ParticleTracK]G400 also captures bimodal character in unweighted chord distributions, producing distinct peaks for aggregates and fines after suboptimal flocculation; such peaks are rarely well resolved in older FBRM".

      "…the chord length measurement principle applied with the G400 probe leads to an enhanced sensitivity to species at the lower end of the measurement range relative to previous generation FBRM…"

      "The mean square-weighted chord lengths reported from older generation FBRM for flocculated minerals are typically under 400 mm, and yet the naked eye can see much larger aggregates being formed in thickener feedwells. The G400 probe consistently measures larger chord lengths, and this is seen as a significant advantage"

George Zhou, Aaron J Moment, James F. Cuff, Wes A. Schafer,Charles Orella, Eric Sirota, Xiaoyi Gong, and Christopher J. Welch, Process Development and Control with Recent New FBRM, PVM, and IR. Org. Process Res. Dev., Just Accepted Manuscript, Publication Date (Web): 10 Jun 2014.

"Process analytical technologies (PATs) have played an important role in process development and optimization throughout the pharmaceutical industry. Recent new PATs, including in-process video microscopy (PVM), a new generation of focused-beam reflectance measurement (FBRM), miniature process IR spectroscopy, and a flow IR sensor, have been evaluated, demonstrated, and utilized in the process development of many drug substances. First, PVM has filled a technical gap by providing the capability to study morphology for particle engineering by visualizing particles in real time without compromising the integrity of sample. Second, the new FBRM G series has closed gaps associated with the old S series with respect to probe fouling, bearing reliability, data analysis, and software integration. Third, a miniaturized process IR analyzer has brought forth the benefits of increased robustness, enhanced performance, improved usability, and ease of use, especially at scale-up".

Hardware Manuals

Quick Reference Guides

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
Changing ParticleTrack G400 Interchangeable Probe Tips
This Quick Reference shows you how to quickly replace a ParticleTrack with FBRM G400 interchangeable probe tip and set the software to recognize the n...
Using the Purge Controller for ParticleTrack G400 or ParticleView V19
The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...

Additional Help

ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...
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ParticleTrack G400