粒度分佈分析 | FBRM和PVM技術
粒度分佈和形狀分析

粒度分佈分析

在實驗室與製程環境下進行即時粒度與形狀分析

 

生產線上粒度分佈分析

粒度分佈難以最佳化、擴充及分析。  藉由採用FBRM技術的ParticleTrack和採用PVM技術的ParticleView,METTLER TOLEDO是即時原位顆粒系統特性解析和分析的全球領導者。 能夠測量製程中自然存在的顆粒,極大地提高我們瞭解、最佳化和控...

粒度分佈難以最佳化、擴充及分析。  藉由採用FBRM技術的ParticleTrack和採用PVM技術的ParticleView,METTLER TOLEDO是即時原位顆粒系統特性解析和分析的全球領導者。 能夠測量製程中自然存在的顆粒,極大地提高我們瞭解、最佳化和控制顆粒及液滴的能力。

常見的應用包括:

自2001年收購Lasentec以來,METTLER TOLEDO一直在推進FBRM和PVM的開發。 從研發實驗室到製造廠,我們在世界各地安裝了數千組設備。我們基於探針的技術被公認為粒度分佈分析的黃金標準。  我們的技術能在顆粒和液滴系統中,測量並視覺化製程中自然存在的顆粒和液滴之變化率和變化程度。


 
Probe-based imaging tool that captures high-resolution images of crystals, particles, and droplets as they exist in process.
New Experimental Insights
Study crystallization, precipitation, suspensions, and emulsions at previously unobtainable levels of detail and reveal new insights that will power process development decision making.
Powerful Analytics with iC Vision
Monitor process changes using simple analytics, or quantify particle size and shape with customized algorithms.
Breakthrough Usability
With a slim, lightweight probe and plug-and-play connection, EasyViewer makes setup and data capture effortless. Smart focus and lighting controls alleviate the burden of manual interventions.
Confident Deployment
EasyViewer is built for frequent use and provides exceptional information - after as little as 15 minutes training.
EasyViewer
將探針式儀器直接插入製程後,可利用聚焦光束反射測量 (FBRM) 技術研究顆粒大小與數量隨時間的變化情況。
測量顆粒大小和數量
透過即時監控顆粒大小和數量,科學家可以使用基於的方法自信地理解、最佳化和擴大製程。
無需採樣也能瞭解
透過追蹤製程中自然存在的顆粒之大小和數量變化,科學家即便在極端溫度和壓力下,也可以安全地瞭解製程,並且沒有時間延遲。
自信地開發製程
隨著實驗條件的變化,持續追蹤顆粒大小和數量,能夠最佳化製程,並在一致的基礎上獲得符合用途的顆粒。
在實驗室與工廠中進行部署
透過監控製程,可以快速發現混亂情況,並利用在全規模生產中收集的證據來進行改進。
METTLER TOLEDO Lasentec FBRM
將探針式儀器直接插入製程後,可透過採用PVM技術的即時顯微鏡將顆粒視覺化。
研究顆粒大小、形狀與結構
透過獲取過程中所存在顆粒的即時顯微鏡影像,科學家能夠即時地全面瞭解每個顆粒系統的過程。
擷取難以捉摸的機制
透過視覺化晶體、液滴和其他精細顆粒的結構,科學家可以描述對過程及產品品質至關重要的瞬態事件和難以捉摸的機制。
研究關鍵過程事件
基於影像的趨勢對顆粒大小和濃度變化敏感,有助於科學家確定並研究縮短開發過程時間的重要事件
獲得證據以實現最佳化
透過在線視覺化顆粒和顆粒機制,科學家可以獲得獨特的知識,從而以更低的成本進行更加智慧型的過程開發。
用於晶體、顆粒和液滴的即時顯微鏡
EasyViewer

Probe-based imaging tool that captures high-resolution images of crystals, particles, and droplets as they exist in process.

New Experimental Insights
Study crystallization, precipitation, suspensions, and emulsions at previously unobtainable levels of detail and reveal new insights that will power process development decision making.
Powerful Analytics with iC Vision
Monitor process changes using simple analytics, or quantify particle size and shape with customized algorithms.
Breakthrough Usability
With a slim, lightweight probe and plug-and-play connection, EasyViewer makes setup and data capture effortless. Smart focus and lighting controls alleviate the burden of manual interventions.
Confident Deployment
EasyViewer is built for frequent use and provides exceptional information - after as little as 15 minutes training.
METTLER TOLEDO Lasentec FBRM

將探針式儀器直接插入製程後,可利用聚焦光束反射測量 (FBRM) 技術研究顆粒大小與數量隨時間的變化情況。

測量顆粒大小和數量
透過即時監控顆粒大小和數量,科學家可以使用基於的方法自信地理解、最佳化和擴大製程。
無需採樣也能瞭解
透過追蹤製程中自然存在的顆粒之大小和數量變化,科學家即便在極端溫度和壓力下,也可以安全地瞭解製程,並且沒有時間延遲。
自信地開發製程
隨著實驗條件的變化,持續追蹤顆粒大小和數量,能夠最佳化製程,並在一致的基礎上獲得符合用途的顆粒。
在實驗室與工廠中進行部署
透過監控製程,可以快速發現混亂情況,並利用在全規模生產中收集的證據來進行改進。
用於晶體、顆粒和液滴的即時顯微鏡

將探針式儀器直接插入製程後,可透過採用PVM技術的即時顯微鏡將顆粒視覺化。

研究顆粒大小、形狀與結構
透過獲取過程中所存在顆粒的即時顯微鏡影像,科學家能夠即時地全面瞭解每個顆粒系統的過程。
擷取難以捉摸的機制
透過視覺化晶體、液滴和其他精細顆粒的結構,科學家可以描述對過程及產品品質至關重要的瞬態事件和難以捉摸的機制。
研究關鍵過程事件
基於影像的趨勢對顆粒大小和濃度變化敏感,有助於科學家確定並研究縮短開發過程時間的重要事件
獲得證據以實現最佳化
透過在線視覺化顆粒和顆粒機制,科學家可以獲得獨特的知識,從而以更低的成本進行更加智慧型的過程開發。

服務

即時顆粒大小分析服務

+886 2 2657 8898
聯絡服務

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從安裝、預防性維護、校正到設備維修,我們在量測設備的整個生命週期內都會提供支援與檢修服務。

專業知識
訓練和諮詢

支援

ParticleTrack和ParticleView支援文件

G400硬體支援

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
Changing ParticleTrack G400 Interchangeable Probe Tips
This Quick Reference shows you how to quickly replace a ParticleTrack with FBRM G400 interchangeable probe tip and set the software to recognize the n...
Using the Purge Controller for ParticleTrack G400 or ParticleView V19
The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...
ParticleTrack G600 Hardware Manual
This manual covers safety and quality information relating to the METTLER TOLEDO ParticleTrack G600 with FBRM (Focused Beam Reflectance Measurement) t...
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...

V19硬體支援

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
Using the Purge Controller for ParticleTrack G400 or ParticleView V19
The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...
ParticleView V19 Hardware Manual
This manual covers specific safety and quality information relating to the ParticleView V19 with PVM (Particle Vision Measurement) technology. The P...
ParticleView V19 Safety Manual
This safety manual supplements the ParticleView V19 with PVM Technology Hardware Manual.
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...

G600硬體支援

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
ParticleTrack G600 Hardware Manual
This manual covers safety and quality information relating to the METTLER TOLEDO ParticleTrack G600 with FBRM (Focused Beam Reflectance Measurement) t...
ParticleTrack G600Ex Hardware Manual
This manual covers safety and quality information relating to the ParticleTrack G600Ex with FBRM (Focused Beam Reflectance Measurement) technology.
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...

軟體支援

iC PVM Software Quick Start Guide
This guide introduces a new user to the iC PVM software graphical user interface (GUI) and describes several choices for getting started. Create and r...
iC PVM Software User Install Guide
iC PVM installation is wizard-guided. This guide includes detailed installation steps along with implementation information for the iC PVM administra...
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...
iC PVM particle characterization software
Acquire and share process knowledge by viewing particles in real time to understand particle size, shape and concentration with iC PVM Software.
 
 
 
 
 
 
 
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