Particle Size Analyzers | FBRM and PVM Instruments

Particle Size Analyzers

Real Time Particle Size Analyzers For Laboratory and Process Environments

A particle size analyzer is an analytical instrument that measures, visualizes, and reports a particle size distribution for a given particle or droplet population. Particle size analyzers play an important role during process development and quality control of particle systems in order to develop efficient processes and achieve high final product quality.

Traditionally, sampling and offline particle size analyzers (laser diffraction, dynamic light scattering, sedimentation, or sieve rest analysis) were used for product quality control. However, common sampling challenges, increasing pressure to expedite process development, and a higher demand for "right first time" processes required the development of in situ particle size analyzer. The ability to measure particles as they naturally exist in a process has dramatically improved the ability to understand, optimize and control particle and droplet systems.

METTLER TOLEDO offers two different types of particles size analyzers. EasyViewer is an in situ video microscope that uses advanced image analysis to determine particles size. ParticleTrack is an in situ particle size analyzer that uses Focus Beam Reflectance Measurement (FBRM) to determine particle size.

Probe-based imaging tool that captures high-resolution images of crystals, particles, and droplets as they exist in process.
New Experimental Insights
Study crystallization, precipitation, suspensions, and emulsions at previously unobtainable levels of detail and reveal new insights that will power process development decision making.
Powerful Analytics with iC Vision
Monitor process changes using simple analytics, or quantify particle size and shape with customized algorithms.
Breakthrough Usability
With a slim, lightweight probe and plug-and-play connection, EasyViewer makes setup and data capture effortless. Smart focus and lighting controls alleviate the burden of manual interventions.
Confident Deployment
EasyViewer is built for frequent use and provides exceptional information - after as little as 15 minutes training.
EasyViewer
Probe-based instrument inserted directly into a process to study how particle size and count change over time with Focused Beam Reflectance Measurement (FBRM) technology.
Measure Particle Size and Count
By monitoring particle size and count in real time, scientists can understand, optimize and scale-up processes confidently using evidence-based methods.
Understand Without Sampling
By tracking changes to size and count, as particles naturally exist in process, scientists obtain process understanding safely and with no time delay - even at extreme temperatures and pressure.
Develop Processes Confidently
By tracking particle size and count continuously as experimental conditions are varied, it is possible to optimize processes and obtain fit for purpose particles on a consistent basis.
Deploy in the Lab and the Plant
By monitoring manufacturing processes, upsets can be identified quickly and improvements can be made using evidence collected at full production scale.
METTLER TOLEDO Lasentec FBRM
EasyViewer

Probe-based imaging tool that captures high-resolution images of crystals, particles, and droplets as they exist in process.

METTLER TOLEDO Lasentec FBRM

Probe-based instrument inserted directly into a process to study how particle size and count change over time with Focused Beam Reflectance Measurement (FBRM) technology.


Common particle size analyzer applications include:

Since acquiring Lasentec in 2001, METTLER TOLEDO has continued to advance the development of FBRM and PVM particle size analyzers. With thousands of in situ particle size analyzers installed worldwide from the R&D laboratory to the manufacturing plant, our probe-based technologies are acknowledged as the gold standard for particle size distribution analysis.  Our technology, including crystallization equipment, measures and visualizes the rate and degrees of change in particle and droplet systems as they naturally exist in process.

Particle Size Analyzers in Industry-Related Publications:

This selection of journal articles below utilize METTLER TOLEDO particle size analyzers to address measuring solubility and metastable zone, crystallization design, seeding crystallization processes, optimizing crystal shape, monitoring supersaturation, polymoprphic crystallization, phase separation (oiling out), managing impurities, crystallization scale-up, and continuous crystallization.

  • The Effect of Mixing on the Metastable Zone With and Nucleation Kinetics in the Anti-Solvent Crystallization on Benzoic Acid, D. O'Grady, M. Barrett, E. Casey, B. Glennon; Chemical Engineering Research and Design (2007), 85(7): 945 – 952.
  • Characterizing the Metastable Zone Width and Solubility Curve Using Lasentec FBRM and PVM, P. Barrett, B. Glennon; Chemical Engineering Research and Design (2002), 80(7): 799 – 805.
  • Control of the Particle Properties of a Drug Substance by Crystallization Engineering and the Effect on Drug Product Formulaton, S. Kim, B. Lotz, M. Lindrud, K. Girard, T. Moore, K. Nagarajan, M. Alvarez, T. Lee, F. Nikfar, M. Davidovich, S. Srivastava, S. Kiang; Organic Process Research & Development (2005), 9(6): 894 – 901.
  • Process Development Challenges to Accommodate a Late-Appearing Stable Polymorph: A Case Study on the Polymorphism and Crystallization of a Fast-Track Drug Development Compound, S. Desikan, R. Parsons Jr., W. Davis, J. Ward, W. Marshall II, P. Toma; Organic Process Research & Development (2005), 9(6): 933 – 942.
  • PAT-Enabled Determination of Design Space for Seeded and Cooling Crystallization, Z. Yu, P. Chow, R. Tan, W. Ang; Organic Process Research & Development (2013), 17(3): 549 – 556.
  • An In-Line Study of Oiling Out and Crystallization, E. Deneau, G. Steele; Organic Process Research & Development (2005), 9(6): 943 – 950.
  • Modification Of Crystal Shape through Deep Temperature Cycling, M. Jiang, X. Zhu, M. Molaro, M. Rasche, H. Zhang, K. Chadwick, D. Raimondo, K. Kim, L. Zhou, Z. Zhu, M. Wong, D. O'Grady, D. Hebrault, J. Tedesco, R. Braatz; Industrial & Engineering Chemistry Research (2014), 53(13): 5325 – 5336.
  • Optimization of a Crystallization by Online FBRM Analysis of Needle-Shaped Crystals T. Leyssens, C. Baudry, M. Hernandez; Development (2011), 15 (2): 413 – 426.
  • Organic Process Research & Monitoring and Feedback Control of Supersaturation Using ATR-FTIR to Produce an Active Pharmaceutical Ingredient of a Desired Crystal Size, V. Liotta, V. Sabesan; Organic Process Research & Development (2004), 8(3): 488 – 494.
  • Novel, Calibration-Free Strategies for Supersaturation Control in Anti-Solvent Crystallization Processes, D. Duffy, M. Barrett, B. Glennon; Crystal Growth & Design (2013), 13(8): 3321 – 3332.
  • In Situ Monitoring, Control and Optimization of a Liquid-Liquid Phase Separation Crystallization, D. Duffy, N. Cremin, M. Napier, S. Robinson, M. Barrett, H. Hao, B. Glennon; Chemical Engineering Science (2012), 77(30): 112 – 121.
  • The Role of Diastereomer Impurity in Oiling-Out During the Resolution of trans-4-Methyl-2-piperidine Carboxylic Ethyl Ester Enantiomers by Crystallization, R. Ren, D. Sun, T. Wei, S. Zhang, J. Gong; Organic Process Research & Development (2014), 18(6): 709 – 716.
  • Cyclic Auto-Seeded Polythermal Preferential Crystallization − Effect of Impurity Accumulation, F. Czapla, D. Polenske, L. Klukas, H. Lorenz, A. Seidel-Morgenstern; Chemical Engineering and Processing: Process Intensification (2010), 49(1): 22 – 28.
  • In-Line Analysis of Impurity Effects on Crystallization, C. Scott, S. Black, Organic Process Research & Development (2005), 9(6): 890 – 893.
  • Crystallization Improvements of a Diastereomeric Kinetic Resolution through Understanding of Secondary Nucleation, P. Mousaw, K. Saranteas, B. Prytko; Organic Process Research & Development (2008), 12(2): 243 – 248.
  • Characterization of the Anti-Solvent Batch, Plug Flow and MSMPR Crystallization of Benzoic Acid, S. Ferguson, G. Morris, H. Hao, M. Barrett, B. Glennon; Chemical Engineering Science (2013), 104(18): 44 – 54.

Services

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We support and service your measurement equipment through its entire life-cycle, from installation to preventive maintenance and calibration to equipment repair.

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Support

Support Documentation for Particle Size Analyzers

G400 Hardware Support

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
Changing ParticleTrack G400 Interchangeable Probe Tips
This Quick Reference shows you how to quickly replace a ParticleTrack with FBRM G400 interchangeable probe tip and set the software to recognize the n...
Using the Purge Controller for ParticleTrack G400 or ParticleView V19
The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...
ParticleTrack G600 Hardware Manual
This manual covers safety and quality information relating to the METTLER TOLEDO ParticleTrack G600 with FBRM (Focused Beam Reflectance Measurement) t...
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...

V19 Hardware Support

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
Using the Purge Controller for ParticleTrack G400 or ParticleView V19
The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...
ParticleView V19 Hardware Manual
This manual covers specific safety and quality information relating to the ParticleView V19 with PVM (Particle Vision Measurement) technology. The P...
ParticleView V19 Safety Manual
This safety manual supplements the ParticleView V19 with PVM Technology Hardware Manual.
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...

G600 Hardware Support

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
ParticleTrack G600 Hardware Manual
This manual covers safety and quality information relating to the METTLER TOLEDO ParticleTrack G600 with FBRM (Focused Beam Reflectance Measurement) t...
ParticleTrack G600Ex Hardware Manual
This manual covers safety and quality information relating to the ParticleTrack G600Ex with FBRM (Focused Beam Reflectance Measurement) technology.
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...

Software Support

iC PVM Software Quick Start Guide
This guide introduces a new user to the iC PVM software graphical user interface (GUI) and describes several choices for getting started. Create and r...
iC PVM Software User Install Guide
iC PVM installation is wizard-guided. This guide includes detailed installation steps along with implementation information for the iC PVM administra...
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...
iC FBRM Software
iC FBRM delivers key information to help users develop a strong understanding of their particle system dynamics, optimize experimental design, speed d...
iC PVM particle characterization software
Acquire and share process knowledge by viewing particles in real time to understand particle size, shape and concentration with iC PVM Software.
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