ParticleTrack G600/G600 Ex
Monitor Particle Size and Count in Piloting and Production
ParticleTrack G600 with FBRM technology is a rugged probe-based instrument that is inserted directly into large-scale vessels or pipelines to track changing particle size and count in real time at full process concentrations. Particles, particle structures and droplets are monitored continuously, as process parameters vary, allowing engineers to monitor, troubleshoot and improve processes effectively.
Particle size and count directly impact performance in multiphase processes including:
By monitoring particle size and count in real time, at full production scales, engineers can monitor process consistency and identify strategies to make significant process improvements.
Particles can change when sampled and prepared for offline analysis. By tracking changes to size and count, as particles naturally exist in process, engineers obtain process understanding at full production scales, safely and with no time delay – even at extremes of temperature and pressure.
By monitoring particles continuously, as operating conditions vary, it is possible to determine the root cause of poorly performing processes. Operators can identify process upsets quickly and engineers can utilize evidence obtained at full production scale to redesign challenging processes and make improvements.
A flexible mounting system allows probes to be installed in reactors or pipelines using standard flanges, dip pipes and ball valves across a wide range of temperatures and pressures. Optional purged enclosures rated to ATEX and Class I, Div 1 standards ensure instruments can be installed safely in hazardous locations.
|Measurement Range||0.5 – 2000μm|
|Temperature Range (Base/Field Unit)||G600: 0 to 45°C; G600Ex: 0 to 40°C|
|Base Unit Description||Stainless 316, 4X, IP66|
|Base Unit Dimension (HxWxL)||524 mm x 828 mm x 284 mm|
|Certifications||CE Approved, Class 1 Laser, NRTL Certified, CB Scheme Certified|
|Power Requirements||100-240VAC, 50/60Hz, 0.5A|
|For Use In||Pilot Plant or Production|
|Software||iC FBRM (Standard); iC Process for FBRM (Optional)|
|Chord Selection Method (CSM)||Primary (fines) AND Macro (coarse)|
|Probe Wetted Length||R: 400mm; T: 400m; P: 1000mm; X: custom|
|Probe Wetted Alloy||SS316 (Standard); C22 (Optional)|
|Standard Window Seals||Kalrez®|
|Probe/Window Options||TM Window; Electropolish|
|Pressure Rating (Probe)||10barg (standard); up to 250barg (custom)|
|Temperature Rating (Probe)||-10 to 120°C (standard); -80 to 150°C (custom)|
|Conduit Length||15m [49.2ft] (standard); 20m [65.6ft] (custom)|
|Air Requirements||Scanner Requirements: Min. pressure: 4barg [60psig]; Flow: 28.3 NL/min [1.0SCFM]|
|ParticleTrack Model||ParticleTrack G600 Process Technology for Pilot/Production|
|G600 Certification||CE Approved, Class 1 Laser, NRTL Certified, CB Scheme Certified|
|G600Ex Certification||ATEX / IECEx Zone 1/21 and Class 1 Div 1 Certified, CE Approved, Class 1 Laser, NRTL Certified|
|Purge Requirements (G600 Ex Only)||Pressure: 4 to 8 barg (60-120 psig); Flow: 225 SLPM (8.0 SCFM)|
|Material Number(s)||14422846, 14422847|
- Study Particle Size and Count Over Time
Scientists insert ParticleTrack probes directly into process streams to monitor particle size and count continuously over time without having to take a sample. This unique information becomes the basis for effective understanding of every process that involves crystals, particles and droplets.
- Link the Process to the Particle System
With ParticleTrack, scientists routinely determine how process parameters influence particle systems. The impact of process parameters on mechanisms such as growth, agglomeration, breakage and shape change can be identified, allowing processes to be optimized and improved using evidence-based methods.
- Create Fit-for-Purpose Particle Systems
Scientists use ParticleTrack to determine how particles with the desired size and count can be delivered consistently. By choosing optimized process parameters during development, through scale-up and into production, scientists deliver high quality particle products to the market faster at a lower total cost.
- Monitor and Correct Process Deviations
ParticleTrack is used to monitor, troubleshoot and improve established processes in production. Difficult processes, where sampling is a challenge, can be monitored safely, ensuring particles with the highest possible quality are produced consistently.
Upgrade to G600/Ex
ParticleTrack G600/G600 Ex Upgrade
ParticleTrack G600/G600Ex represents a significant improvement over previous METTLER TOLEDO Lasentec FBRM technologies (D600/D600Ex).
Stuck Particle Correction Improves Consistent and Reliable Measurement - ParticleTrack can distinguish between particles stuck on the probe window and those moving in the process. These stuck particles can be removed from the data ensuring a consistent and reliable measurement for more experiments.
Improved Measurement Accuracy and Resolution - ParticleTrack uses state-of-the art digital signal processing methods to measure particle size with increased accuracy and resolution. These changes mean the measurement matches particle measurements such as laser diffraction and imaging more closely.
Wider Dynamic Range To Detect Critical Process Events - ParticleTrack measures changes in particle count to accurately eliminate concentration-related artifacts from the data and ensure improved sensitivity to changes in the particle system at higher concentrations. This allows critical process events to be detected that may previously have gone unobserved.
Two Measurements Acquired Simultaneously To Eliminate Need for Prior System Information or Trial Experimentation - ParticleTrack now collects two datasets simultaneously that are optimized for different types of particle systems. This eliminates the need for any a prior system information or trial experimentation to determine the optimal measurement method.
Improved Instrument to Instrument Repeatability - ParticleTrack technology was developed to ensure different lab and production instruments now measure much more closely, allowing changes in scale of measurement to be decoupled from differences in the probe used to measure them.
Voice of User
Senaputra, A., Jones, F., Fawell, P. D. and Smith, P. G. (2014), Focused beam reflectance measurement for monitoring the extent and efficiency of flocculation in mineral systems. AIChE J., 60: 251–265. doi: 10.1002/aic.14256.
"The [ParticleTracK]G400 also captures bimodal character in unweighted chord distributions, producing distinct peaks for aggregates and fines after suboptimal flocculation; such peaks are rarely well resolved in older FBRM".
"…the chord length measurement principle applied with the G400 probe leads to an enhanced sensitivity to species at the lower end of the measurement range relative to previous generation FBRM…"
"The mean square-weighted chord lengths reported from older generation FBRM for flocculated minerals are typically under 400 mm, and yet the naked eye can see much larger aggregates being formed in thickener feedwells. The G400 probe consistently measures larger chord lengths, and this is seen as a significant advantage"
George Zhou, Aaron J Moment, James F. Cuff, Wes A. Schafer,Charles Orella, Eric Sirota, Xiaoyi Gong, and Christopher J. Welch, Process Development and Control with Recent New FBRM, PVM, and IR. Org. Process Res. Dev., Just Accepted Manuscript, Publication Date (Web): 10 Jun 2014.
"Process analytical technologies (PATs) have played an important role in process development and optimization throughout the pharmaceutical industry. Recent new PATs, including in-process video microscopy (PVM), a new generation of focused-beam reflectance measurement (FBRM), miniature process IR spectroscopy, and a flow IR sensor, have been evaluated, demonstrated, and utilized in the process development of many drug substances. First, PVM has filled a technical gap by providing the capability to study morphology for particle engineering by visualizing particles in real time without compromising the integrity of sample. Second, the new FBRM G series has closed gaps associated with the old S series with respect to probe fouling, bearing reliability, data analysis, and software integration. Third, a miniaturized process IR analyzer has brought forth the benefits of increased robustness, enhanced performance, improved usability, and ease of use, especially at scale-up".