XP205 - Analytical Balance - 退市产品

With the Excellence Plus XP, METTLER TOLEDO has set another milestone in the world of analytical balances. Cutting-edge innovations bring unprecedented weighing performance and set new standards in terms of personnel, sample and data security.


Special Features:

  • SmartGrid: unparalleled weighing performance, thanks to the revolutionary grid weighing pan which successfully minimizes the effects of turbulence in the weighing chamber. Results are more accurate and stabilization times dramatically shorter.
  • SmartSens: hands-free operation for personnel security The user can concentrate fully on the safe handling of samples to avoid spillage and minimize the risk of contamination.
  • SmartScreen: guides the user by color for safe operation. Outstanding ease of use with touch-screen technology.
  • LevelControl: warns if the balance is not correctly levelled to ensure the accuracy of your results.
  • Connectivity: pace-setting interfacing flexibility - including Ethernet, Bluetooth (wireless connection) and PS/2 - for efficient data capture and easy network integration.
  • Integrated anti-static kit (option): discharge static samples instantly without any risk of contamination.
  • ErgoClip for secure placement of all tare containers
  • Automatic and detachable draftshield
  • proFACT
  • RS-232C interface, option slot for second interface, choice of 7 different interfaces
  • Inner draftshield plate, adjustable
  • Protective cover
  • Prepared for weighing below the balance
  • Detachable and adjustable Terminal
  • QM-Toolbox, including user administration and password protection
  • MinWeigh, Target weighing, Percent weighing, Piece counting with reference optimization
  • Density determintation
  • Alphanumeric data entry of 4 ID's

停止自: Dec, 2015

拨打电话询价

替换为 电子天平 XPR205

每次均得有效结果

每次均得有效结果.XPR分析天平、220 g量程、0.01 mg可读性、7''电容彩色触摸屏、用户管理、静电检测、自动内部校正且配有LabX

一次即准的结果

集成的StatusLight™、LevelControl和GWP Approved协同作用,确保各项条件处于更佳状态,获得正确的称量结果。

StaticDetect

由于具备StaticDetect专业功能,XPR微量天平和分析天平可检测样品和容器的静电放电。

随时可进行审核

将XPR分析天平连接至LabX软件,为法规遵从和数据完整性提供全面支持。

附件 - XP205 - Analytical Balance

规格- XP205 - Analytical Balance