ParticleView V19 - Overview - METTLER TOLEDO

ParticleView V19

View Inline Particle Size and Shape in Real Time With In Situ PVM images

ParticleView V19 with PVM (Particle Vision and Measurement) technology is a probe-based video microscope that visualizes particles and particle mechanisms as they exist in process.  High resolution images are continuously captured under a wide range of process conditions without the need for sampling or offline analysis. A process trend, sensitive to changes in particle size and concentration, is automatically combined with the most relevant images, providing scientists with a straightforward and reliable method to ensure comprehensive understanding is acquired with every experiment.

  • Study Particle Size and Shape - High resolution imaging of particles in real time enables scientists to determine the influence of process parameters on particle size and shape.  Particles can be designed to behave predictably as key parameters change during development, scale-up and manufacturing.
  • Characterize Transient Events and Elusive Mechanisms - Particles and particle structures often change when sampled.  By visualizing crystals, droplets and other delicate particle structures inline, scientists can characterize transient events and elusive mechanisms that may be critical for optimizing the quality of a product or process.
  • Investigate Critical Process Events and Upsets - An image-based trend, sensitive to changing particle size, shape and concentration, helps scientists identify and then investigate important process events and upsets.  The fast and reliable method reduces the time and effort needed to fully understand complex particle systems and processes.
  • Make Evidence-Based Decisions At a Lower Cost - By visualizing particles and particle mechanisms inline, scientists acquire knowledge that would otherwise prove too difficult or time consuming to obtain.  Such knowledge supports evidence-based decision making and process development at a lower cost.
ParticleView V19 With PVM Technology

View the Video To Learn More About Real Time Microscopy For Particles, Crystals and Droplets

Common V19 applications include:

  • Understanding crystallization processes
  • Identifying mechanisms such as growth, agglomeration, breakage, and shape changes
  • Controlling particle size and shape
  • Monitoring polymorphic transitions
  • Identifying the source of batch-to-batch inconsistencies
  • Optimizing oil/water separations
  • Viewing particle and droplet systems where sampling is not possible
Specifications - ParticleView V19
Probe Wetted Material C22 alloy
Probe Window Material Sapphire
Probe Wetted Temperature Range -80 °C to 120 °C (purged); 10 °C to 120 °C (standard)
Probe Back End Temperature Range 0 °C – 40 °C
Probe Wetted Pressure Range 0 barg to 10 barg (standard); up to 100 barg (custom)
Certifications IEC/UL/CSA 61010-1; EN 61326-1; Class 1 Laser Device compliant with 21CFR1040.10, 21CFR1040.11 and IEC 60825; Probe back end rated for IP65 and 4X
For Use In Laboratory: EasyMax, OptiMax or Larger
Software iC PVM
Imaging System Front Lasers: Backscattered images; Back Lasers: Transmission images with use of optional clamp-on reflector
Illumination Internal light source; Front Lasers: 4; Back Lasers: 4
Probe Window Seals TM (standard, no o-rings)
Probe Diameter 19 mm [0.75 in]
Probe Wetted Length 400 mm [15.75 in]
Conduit Length 2 m [6.6 ft]
Field of View 1300 μm x 890 μm
Optical Resolution > 2 μm
Image Resolution 1500 x 1024 pixels
Weight (probe, interface unit and cables) 1.45 kg [3.20 lb]
Air Requirements Always use clean, dry instrument quality air or Nitrogen; Low flow purge (optional, use to avoid condensation), 1.4 barg [20 psig], 0.5 SLPM [0.02 SCFM]
Power Requirements Powered USB extender; 100-240V (auto-switching), 50/60Hz, 0.3A
Material Number(s) 14000031



ParticleView V19 With PVM Technology
Visualize particles and particle mechanisms in real time to study particle size and shape
iC PVM Software
View particles in real time to study particle size, shape and concentration with iC PVM

White Papers

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ParticleView V19


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Support Documentation for ParticleView V19

Hardware Manuals

ParticleView V19 Hardware Manual
This manual covers specific safety and quality information relating to the ParticleView V19 with PVM (Particle Vision Measurement) technology. The P...

Quick Reference Guides

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
Using the Purge Controller for ParticleTrack G400 or ParticleView V19
The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...

Software Support

iC PVM particle characterization software
Acquire and share process knowledge by viewing particles in real time to understand particle size, shape and concentration with iC PVM Software.

Additional Help

ParticleView V19 Safety Manual
This safety manual supplements the ParticleView V19 with PVM Technology Hardware Manual.
ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...
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