Jim has the Answer: Microelectronics UPW Waters Expert
Importance of Trace Silica Measurement in Microelectronic UPW
This webinar provides expert information on key topics related to key elements on the silica measurement for UPW treatment. Conducted by METTLER TOLEDO's UPW water expert Jim Cannon, actively involved in the standards and regulatory organizations for the Semiconductor and Photovoltaic markets, including the Facilities and Liquids Committee, Reclaim/Reuse/Recycle and the UPW Task Force, the 90 min session covers key topics:
- New Standards for UPW in Microelectronics Industry
- Latest Online Trace Silica Measurement Technology
- New 2850Si Analyzer with Outstanding Features, Benefits and Advantages in achieving High Reliability and Accuracy
