PVM® V819 技术 - 纵览 - 梅特勒-托利多

PVM® V819 技术 - 退市产品


PVM ®使科学家和工程师们能够在工艺过程的实际浓度下、以其在工艺过程中自然存在的状态下观看并存储晶粒、颗粒、与液滴的显微镜质量的实时图像。

PVM® V819的设计是针对实验室规模的研发,帮助加速对颗粒与液滴体系的研究和理解 - 无需采样和稀释。

PVM® V819的主要特点包括:

  • 用于工艺过程研发的国际领先探头式显微镜
  • 现有的最小PVM® 探头尺寸(19mm直径)便于安装在不同工作体积的容器里(小至250毫升以下、大至2升以上)
  • 显微镜质量的分辨率;在大部分颗粒与液滴体系里,拥有辨别2微米和2微米以上颗粒的能力
  • 可以通过对PVM®加以优化的内建算法进行实时图像分析。图像可输入到任何一个标准图像分析软件包。 

停止自: Nov, 2014

服务- PVM® V819 技术


文件记录 - PVM® V819 技术


Polymorph and Pseudo-polymorph Transition in-process monitoring of habit change
Improve purity by ensuring total polymorphic form conversion. Enhance process robustness by monitoring crystallization processes in real time. Charact...

附件 - PVM® V819 技术

Specifications - PVM® V819 技术

Probe Tip MaterialAlloy-22 Wetted
Probe WindowSapphire
Probe Diameter19mm
Probe Length400 mm
Field of View1075mm x 825mm
Resolution2 μm
Temperature Range-80°C to 120°C
PressureVacuum to 10 bar
Conduit Length5m
CertificationCE, Class 1 M Laser
Controller and SoftwareLaptop or Desktop Connections

PVM® V819 Probe Specifications

  • Tip Diameter: 19mm
  • Probe Length: 400mm
  • Housing Diameter: 69mm
  • Overall Length: 563mm

PVM® V819 Field Unit Specifications

  • 177w x 376d x 182h

METTLER TOLEDO is the world leader in Process Analytical Technology (PAT) to track real-time changes to particle dimension and shape.  After purchasing Lasentec® in 2001, METTLER TOLEDO has over 20 years experience with inline particle characterization.

规格- PVM® V819 技术

规格 - PVM® V819 技术
分辨率 2 to 1000μm
探头直径 19mm
探头润湿长度 400mm
探头浸润合金 C22
窗口 Sapphire
标准窗密封件 TM Window
探头/窗口选择 RE Probe (RE Window capability ordered with system as probe option)
压力等级(探头) 10barg (standard)
up to 100barg
温度额定值 (探头) -80 to 120°C
管道长度 5m [16.4ft]
附件描述 Laboratory Base Unit
温度范围 (主机/现场单元) 5 to 35°C
主机/现场单元尺寸(非运输尺寸) Height: 182mm [7.2in]
Width: 177mm [7.0in]
Depth: 376mm [14.8in]
证书 CE Approved, Class 1 Laser
气源条件 Low flow purge: (reuired at low and high temperatures)
Pressure: 0.4barg [5psig]
Flow: 10NL/min [0.4SCFM]
电源条件 100-240VAC, 50-60Hz
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