ParticleTrack G600/G600 Ex - 纵览 - 梅特勒托利多

ParticleTrack G600/G600 Ex

在中试和生产中监控粒度和粒数

采用 FBRM 技术的 ParticleTrack G600 是直接插入到大型容器或管道中的坚固探头式仪器,以便在全工艺过程浓度下实时追踪颗粒粒径及粒数变化。 随着过程参数的变化,持续监测颗粒、颗粒结构和液滴允许工程师有效地监控、解决并改进过程。

颗粒粒径与粒数直接影响多相工艺中的性能,包括:

通过在全生产规模下实时监测颗粒粒径与粒数,工程师可以监控过程的一致性并确定进行过程改进的策略。

在为离线分析进行采样和制备时,颗粒可能发生变化。 通过追踪过程中自然存在的颗粒粒径与粒数的变化,工程师能够在全生产规模下安全且无延迟地了解工艺过程 – 甚至是在极端温度与压力条件下。

随着操作条件的变化,通过连续监测颗粒,能够确定过程性能不佳的根本原因。 操作人员可以快速识别过程扰动,工程师可以利用在全生产规模下获得的证据,重新设计具有挑战性的过程并加以改进。

灵活的安装系统允许在各种温度和压力下,使用标准法兰、套管和球阀在反应器或管道中安装探头。 额定为 ATEX 和 I 级 1 区标准的可选吹扫外壳确保仪器可以在易爆场所进行安全安装。

ParticleTrack G600 Ex with FBRM Technology
拨打电话询价
规格 - ParticleTrack G600/G600 Ex
测量范围
0.5 – 2000μm
温度范围(主机/现场装置)
G600: 0至45°C
G600Ex: 0至40°C
主机说明
不锈钢 316, 防水防尘4X, IP66级
基座尺寸 (长x高x宽)
284 mm x 524 mm x 828 mm
认证
CE 认证, 1 类激光, NRTL 认证, CB Scheme 认证
电源要求
100-240VAC, 50/60Hz, 0.5A
适用于
中试工厂或生产
软件
iC FBRM (标准)
用于 FBRM 的 iC Process (可选)
扫描系统
气动
扫描速度
2m/s
弦长选择方法(CSM)
Primary(精细)和 Macro(粗糙)
探头直径
25mm
探头浸湿长度
P: 1000mm
R: 400mm
X: 自定义
T: 400m
探头浸湿合金
C22 (可选)
SS316 (标准)
测量视窗
蓝宝石
标准窗口封条
Kalrez®
探头/窗口选件
TM 窗口
电抛光
额定压力(探头)
高达 250barg (自定义)
10barg (标准)
额定温度(探头)
-80 至 150°C (自定义)
-10 至 120°C (标准)
导管长度
20m [65.6ft](自定义)
15m [49.2ft] (标准)
空气要求
扫描仪要求: 最小压力: 4barg [60psig]
流量: 28.3 NL/min [1.0SCFM]
ParticleTrack型号
适用于中试工厂/生产的 ParticleTrack G600 加工技术
G600Ex认证
ATEX / IECEx Zone 1/21和Class 1 Div 1认证、CE认证、1级激光设备、NRTL认证
吹扫要求(仅G600 Ex)
压力: 4至8barg(60-120 psig)
流量: 225 SLPM(8.0 SCFM)
G600认证
CE 认证, 1 类激光, NRTL 认证, CB Scheme 认证

除以上标准配置外,我们也可为您提供定制服务

  • 实时研究颗粒粒径与粒数
    科学家将 ParticleTrack 探头直接插入到过程流体中,以长时间连续监测颗粒粒径与粒数,而无需采样。 这种独特的信息成为有效了解涉及晶体、颗粒和液滴的过程的基础。

  • 借助 ParticleTrack将过程与颗粒系统相关联
    ,科学家可以定期确定过程参数如何影响颗粒系统。 可以确定过程参数对生长、团聚、破损和形状变化等机制的影响,从而可以使用基于证据的方法对过程进行优化和改进。

  • 创建符合目的的颗粒系统
    科学家使用 ParticleTrack 来确定如何稳定得到所需粒径和粒数的颗粒产品。 在研发、中试到投入生产的过程中,通过选择较佳的过程参数,科学家可以以较低的总成本快速向市场提供高品质的颗粒产品。

  • 监测并纠正过程偏差
    ParticleTrack 用于对生产中的既定过程进行监测、故障排除和改进。 可以安全地监测难以采样的复杂过程,确保一致地生产质量尽可能较高的颗粒。

 

文件记录

Documentation for ParticleTrack G600/G600 Ex

Data Sheets

ParticleTrack G600/G600 Ex Datasheet
Track particles in real time in large scale-vessels or pipelines to track particle size and count in real-time at full-process concentrations.

附件

Upgrade to G600/Ex

ParticleTrack G600/G600 Ex Upgrade

ParticleTrack G600/G600Ex represents a significant improvement over previous METTLER TOLEDO Lasentec FBRM technologies (D600/D600Ex).

Stuck Particle Correction Improves Consistent and Reliable Measurement - ParticleTrack can distinguish between particles stuck on the probe window and those moving in the process. These stuck particles can be removed from the data ensuring a consistent and reliable measurement for more experiments.

ParticleTrack G600/G600 Ex
Figure 1: Comparison of measured chord length distribution for legacy Lasentec FBRM vs. ParticleTrack with FBRM technology.
ParticleTrack G600/G600 Ex
Figure 2: Example of legacy Lasentec FBRM instrument failing to observe bimodal distribution of large and small particles, while ParticleTrack displays higher resolution measurement of both particle sizes.

Improved Measurement Accuracy and Resolution - ParticleTrack uses state-of-the art digital signal processing methods to measure particle size with increased accuracy and resolution. These changes mean the measurement matches particle measurements such as laser diffraction and imaging more closely.

Wider Dynamic Range To Detect Critical Process Events - ParticleTrack measures changes in particle count to accurately eliminate concentration-related artifacts from the data and ensure improved sensitivity to changes in the particle system at higher concentrations.  This allows critical process events to be detected that may previously have gone unobserved.

ParticleTrack G600/G600 Ex
Figure 3: Example of ParticleTrack identifying a secondary nucleation event at the end of a process while at high concentration.
ParticleTrack G600/G600 Ex
Figure 5: Simultaneous measurement using two different modes using ParticleTrack: Primary is sensitive to the primary particles while Macro is sensitive to overall particle structure.

Two Measurements Acquired Simultaneously To Eliminate Need for Prior System Information or Trial Experimentation - ParticleTrack now collects two datasets simultaneously that are optimized for different types of particle systems. This eliminates the need for any a prior system information or trial experimentation to determine the optimal measurement method.

Improved Instrument to Instrument Repeatability - ParticleTrack technology was developed to ensure different lab and production instruments now measure much more closely, allowing changes in scale of measurement to be decoupled from differences in the probe used to measure them.


Voice of User

Senaputra, A., Jones, F., Fawell, P. D. and Smith, P. G. (2014), Focused beam reflectance measurement for monitoring the extent and efficiency of flocculation in mineral systems. AIChE J., 60: 251–265. doi: 10.1002/aic.14256.

      "The [ParticleTracK]G400 also captures bimodal character in unweighted chord distributions, producing distinct peaks for aggregates and fines after suboptimal flocculation; such peaks are rarely well resolved in older FBRM".

      "…the chord length measurement principle applied with the G400 probe leads to an enhanced sensitivity to species at the lower end of the measurement range relative to previous generation FBRM…"

      "The mean square-weighted chord lengths reported from older generation FBRM for flocculated minerals are typically under 400 mm, and yet the naked eye can see much larger aggregates being formed in thickener feedwells. The G400 probe consistently measures larger chord lengths, and this is seen as a significant advantage"

George Zhou, Aaron J Moment, James F. Cuff, Wes A. Schafer,Charles Orella, Eric Sirota, Xiaoyi Gong, and Christopher J. Welch, Process Development and Control with Recent New FBRM, PVM, and IR. Org. Process Res. Dev., Just Accepted Manuscript, Publication Date (Web): 10 Jun 2014.

"Process analytical technologies (PATs) have played an important role in process development and optimization throughout the pharmaceutical industry. Recent new PATs, including in-process video microscopy (PVM), a new generation of focused-beam reflectance measurement (FBRM), miniature process IR spectroscopy, and a flow IR sensor, have been evaluated, demonstrated, and utilized in the process development of many drug substances. First, PVM has filled a technical gap by providing the capability to study morphology for particle engineering by visualizing particles in real time without compromising the integrity of sample. Second, the new FBRM G series has closed gaps associated with the old S series with respect to probe fouling, bearing reliability, data analysis, and software integration. Third, a miniaturized process IR analyzer has brought forth the benefits of increased robustness, enhanced performance, improved usability, and ease of use, especially at scale-up".

Support

Support for G600/G600 Ex

Hardware Manuals

ParticleTrack G600 Hardware Manual
This manual covers safety and quality information relating to the METTLER TOLEDO ParticleTrack G600 with FBRM (Focused Beam Reflectance Measurement) t...
ParticleTrack G600Ex Hardware Manual
This manual covers safety and quality information relating to the ParticleTrack G600Ex with FBRM (Focused Beam Reflectance Measurement) technology.

Quick Reference Guides

Positioning a ParticleTrack or ParticleView Probe
ParticleTrack probes use Focused Beam Reflectance Measurement (FBRM) technology to track the rate and degree of change to particles and particle struc...
Using the Purge Controller for ParticleTrack G400 or ParticleView V19
The Purge Controller is an optional accessory that can be purchased for use with ParticleTrack G400 and ParticleView V19. Purging is required where...

Software Support

iC OPC UA Server Quick Start Guide
The iC OPC UA Server is a complimentary application provided by METTLER TOLEDO to allow the users of instruments controlled by iC or iControl software...
iC Process for FBRM Quick Reference
This Quick Reference is designed to aid an Operator in monitoring continuous or batch processes using iC Process for FBRM software.
iC Process for FBRM Release Notes
Release notes for iC Process for FBRM for connecting the lab to plant.
iC Process for FBRM Software User Guide
User Guide for iC Process for FBRM Software
iC Process for FBRM User Guide
iC Process for FBRM User Guide for Admins

Additional Help

ParticleTrack & ParticleView Onsite Training
Training and familiarization with ParticleTrack and ParticleView will ensure that all users can walk up to instruments and immediately bring value to...

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软件

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ParticleTrack G600/G600 Ex