采用 FBRM 技术的 ParticleTrack G600 是直接插入到大型容器或管道中的坚固探头式仪器,以便在全工艺过程浓度下实时追踪颗粒粒径及粒数变化。 随着过程参数的变化,持续监测颗粒、颗粒结构和液滴允许工程师有效地监控、解决并改进过程。
颗粒粒径与粒数直接影响多相工艺中的性能,包括:
通过在全生产规模下实时监测颗粒粒径与粒数,工程师可以监控过程的一致性并确定进行过程改进的策略。
在为离线分析进行采样和制备时,颗粒可能发生变化。 通过追踪过程中自然存在的颗粒粒径与粒数的变化,工程师能够在全生产规模下安全且无延迟地了解工艺过程 – 甚至是在极端温度与压力条件下。
随着操作条件的变化,通过连续监测颗粒,能够确定过程性能不佳的根本原因。 操作人员可以快速识别过程扰动,工程师可以利用在全生产规模下获得的证据,重新设计具有挑战性的过程并加以改进。
灵活的安装系统允许在各种温度和压力下,使用标准法兰、套管和球阀在反应器或管道中安装探头。 额定为 ATEX 和 I 级 1 区标准的可选吹扫外壳确保仪器可以在易爆场所进行安全安装。
测量范围 | 0.5 – 2000μm |
温度范围(主机/现场装置) | G600: 0至45°C G600Ex: 0至40°C |
主机说明 | 不锈钢 316, 防水防尘4X, IP66级 |
基座尺寸 (长x高x宽) | 284 mm x 524 mm x 828 mm |
认证 | CE 认证, 1 类激光, NRTL 认证, CB Scheme 认证 |
电源要求 | 100-240VAC, 50/60Hz, 0.5A |
适用于 | 中试工厂或生产 |
软件 | iC FBRM (标准) 用于 FBRM 的 iC Process (可选) |
扫描系统 | 气动 |
扫描速度 | 2m/s |
弦长选择方法(CSM) | Primary(精细)和 Macro(粗糙) |
探头直径 | 25mm |
探头浸湿长度 | P: 1000mm R: 400mm X: 自定义 T: 400m |
探头浸湿合金 | C22 (可选) SS316 (标准) |
测量视窗 | 蓝宝石 |
标准窗口封条 | Kalrez® |
探头/窗口选件 | TM 窗口 电抛光 |
额定压力(探头) | 高达 250barg (自定义) 10barg (标准) |
额定温度(探头) | -80 至 150°C (自定义) -10 至 120°C (标准) |
导管长度 | 20m [65.6ft](自定义) 15m [49.2ft] (标准) |
空气要求 | 扫描仪要求: 最小压力: 4barg [60psig] 流量: 28.3 NL/min [1.0SCFM] |
ParticleTrack型号 | 适用于中试工厂/生产的 ParticleTrack G600 加工技术 |
G600Ex认证 | ATEX / IECEx Zone 1/21和Class 1 Div 1认证、CE认证、1级激光设备、NRTL认证 |
吹扫要求(仅G600 Ex) | 压力: 4至8barg(60-120 psig) 流量: 225 SLPM(8.0 SCFM) |
G600认证 | CE 认证, 1 类激光, NRTL 认证, CB Scheme 认证 |
除以上标准配置外,我们也可为您提供定制服务
ParticleTrack G600/G600Ex represents a significant improvement over previous METTLER TOLEDO Lasentec FBRM technologies (D600/D600Ex).
Stuck Particle Correction Improves Consistent and Reliable Measurement - ParticleTrack can distinguish between particles stuck on the probe window and those moving in the process. These stuck particles can be removed from the data ensuring a consistent and reliable measurement for more experiments.
Improved Measurement Accuracy and Resolution - ParticleTrack uses state-of-the art digital signal processing methods to measure particle size with increased accuracy and resolution. These changes mean the measurement matches particle measurements such as laser diffraction and imaging more closely.
Wider Dynamic Range To Detect Critical Process Events - ParticleTrack measures changes in particle count to accurately eliminate concentration-related artifacts from the data and ensure improved sensitivity to changes in the particle system at higher concentrations. This allows critical process events to be detected that may previously have gone unobserved.
Two Measurements Acquired Simultaneously To Eliminate Need for Prior System Information or Trial Experimentation - ParticleTrack now collects two datasets simultaneously that are optimized for different types of particle systems. This eliminates the need for any a prior system information or trial experimentation to determine the optimal measurement method.
Improved Instrument to Instrument Repeatability - ParticleTrack technology was developed to ensure different lab and production instruments now measure much more closely, allowing changes in scale of measurement to be decoupled from differences in the probe used to measure them.
Voice of User
Senaputra, A., Jones, F., Fawell, P. D. and Smith, P. G. (2014), Focused beam reflectance measurement for monitoring the extent and efficiency of flocculation in mineral systems. AIChE J., 60: 251–265. doi: 10.1002/aic.14256.
"The [ParticleTracK]G400 also captures bimodal character in unweighted chord distributions, producing distinct peaks for aggregates and fines after suboptimal flocculation; such peaks are rarely well resolved in older FBRM".
"…the chord length measurement principle applied with the G400 probe leads to an enhanced sensitivity to species at the lower end of the measurement range relative to previous generation FBRM…"
"The mean square-weighted chord lengths reported from older generation FBRM for flocculated minerals are typically under 400 mm, and yet the naked eye can see much larger aggregates being formed in thickener feedwells. The G400 probe consistently measures larger chord lengths, and this is seen as a significant advantage"
George Zhou, Aaron J Moment, James F. Cuff, Wes A. Schafer,Charles Orella, Eric Sirota, Xiaoyi Gong, and Christopher J. Welch, Process Development and Control with Recent New FBRM, PVM, and IR. Org. Process Res. Dev., Just Accepted Manuscript, Publication Date (Web): 10 Jun 2014.
"Process analytical technologies (PATs) have played an important role in process development and optimization throughout the pharmaceutical industry. Recent new PATs, including in-process video microscopy (PVM), a new generation of focused-beam reflectance measurement (FBRM), miniature process IR spectroscopy, and a flow IR sensor, have been evaluated, demonstrated, and utilized in the process development of many drug substances. First, PVM has filled a technical gap by providing the capability to study morphology for particle engineering by visualizing particles in real time without compromising the integrity of sample. Second, the new FBRM G series has closed gaps associated with the old S series with respect to probe fouling, bearing reliability, data analysis, and software integration. Third, a miniaturized process IR analyzer has brought forth the benefits of increased robustness, enhanced performance, improved usability, and ease of use, especially at scale-up".